At Alcatel-Lucent, we test chassis-level products that provide 42 board slots on a midplane, essentially a passive backplane that accepts boards on its front and rear sides. Thirty-four of those slots ...

The traditional approach to moving scan test data from chip-level pins to core-level scan channels is under pressure due to the dramatic rise in design size, design complexity, and test adaptation. To ...

Yield improvement at sub 100-nm technologies relies on the latest scan test techniques. As IC feature sizes shrink below 90 nm, in-line inspection techniques to determine yield-limiting problems ...

For decades, process and design scaling has triggered the adoption of transformative test solutions. About twenty years ago, when at-speed test became a de-facto requirement, on-chip compression ...

Boundary scan (IEEE 1149.1) evolved as a board-level test method, but new developments are making the technology attractive for embedded and system-level test and in-system programming operations.

For some time, engineers have followed the IEEE 1149.1 standard, also known as “boundary-scan,” to create test structures on pc boards and in complete systems. Unfortunately, once products leave a ...

The specialist will ask you to complete tests similar to those you have already done at your GP surgery. The specialist will see how you answer different types of questions, for example: using your ...

A 35-year-old executive from Gurugram found that long work hours, poor diet and inactivity had quietly damaged her heart.